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0306 - Physical Chemistry (incl. Structural) >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/2328/8801
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| Title: | Measuring the electronic structure of disordered
overlayers by electron momentum spectroscopy: the Cu/Si interface |
| Authors: | Nixon, Kate Louise
Vos, M
Bowles, C
Ford, Michael J |
| Issue Date: | 2006 |
| Citation: | Nixon, K.L., Vos, M., Bowles, C., &
Ford, M., 2006. Measuring the electronic structure of disordered overlayers by electron
momentum spectroscopy: the Cu/Si interface. Surface and Interface Analysis, 38(8),
1236-1241. |
| URI: | http://hdl.handle.net/2328/8801 |
| ISSN: | 0142-2421 |
| Appears in Collections: | 0306 - Physical Chemistry (incl. Structural)
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