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dc.contributor.authorRidings, Christiaan Rowland Paul
dc.contributor.authorAndersson, Gunther
dc.date.accessioned2014-09-30T06:01:28Z
dc.date.available2014-09-30T06:01:28Z
dc.date.issued2010en_US
dc.identifier.citationRidings, C.R.P. and Andersson, G. (2010). Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy. Review of Scientific Instruments, 81(11) pp. 113907-1-113907-8.en
dc.identifier.issn0034-6748en_US
dc.identifier.urihttp://hdl.handle.net/2328/31475
dc.titleDetermining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopyen_US
dc.typeArticleen_US
dc.identifier.rmid2006019667en_US
dc.identifier.doihttps://doi.org/10.1063/1.3491736en
dc.subject.forgroup0202 Atomic, Molecular, Nuclear, Particle and Plasma Physicsen_US
dc.subject.forgroup0306 Physical Chemistry (incl. Structural)en_US
local.contributor.authorOrcidLookupAndersson, Gunther: https://orcid.org/0000-0001-5742-3037en_US


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