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dc.contributor.authorDeslandes, Alec
dc.contributor.authorJasieniak, Marek
dc.contributor.authorShapter, Joseph George
dc.contributor.authorFairman, Callie
dc.contributor.authorGooding, John Justin
dc.contributor.authorHibbert, D B
dc.contributor.authorQuinton, Jamie Scott
dc.contributor.authorIonescu, Mihail
dc.date.accessioned2014-09-30T06:01:34Z
dc.date.available2014-09-30T06:01:34Z
dc.date.issued2009en_US
dc.identifier.citationDeslandes, A., Jasieniak, M., Ionescu, M., Shapter, J.G., Fairman, C., Gooding, J.J., et al. (2009). ToF-SIMS characterisation of methane-and hydrogen-plasma-modified graphite using principal components analysis. Surface and Interface Analysis, 41 pp. 216-224.en
dc.identifier.issn0142-2421en_US
dc.identifier.urihttp://hdl.handle.net/2328/31479
dc.titleToF-SIMS characterisation of methane-and hydrogen-plasma-modified graphite using principal components analysisen_US
dc.typeArticleen_US
dc.identifier.rmid2006011867en_US
dc.identifier.doihttps://doi.org/10.1002/sia.3010en
dc.subject.forgroup0204 Condensed Matter Physicsen_US
local.contributor.authorOrcidLookupShapter, Joseph George: https://orcid.org/0000-0002-4000-2751en_US
local.contributor.authorOrcidLookupQuinton, Jamie Scott: https://orcid.org/0000-0003-0088-7361en_US


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